CH3715
Introduction to Analysis of Materials
2019-2020
10
5
SCQF level 9
2
Academic year(s): 2019-2020
SCOTCAT credits : 10
ECTS credits : 5
Level : SCQF level 9
Semester: 2
Planned timetable:
The objective of this module is to introduce the principles of the most popular materials analysis methods using X-ray, ion beams, electrons and diffraction methods. The module will cover analytical principles of scanning and transmission electron microscopy (SEM, TEM), X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) together with secondary ion mass spectroscopy (SIMS) and X-ray Diffraction methods (XRD). Diffraction techniques will also be covered with the introductory aspects of Electron Energy Loss Spectroscopy (EELS) together with vibrational spectroscopic techniques.
Pre-requisite(s): Before taking this module you must pass CH2701 and pass at least 1 module from {CH2501, CH2601, CH2603}
Weekly contact: 2 - 3 lectures per week over 5 - 7 weeks (Weeks 1-7) and 2 - 3 tutorials in total.
Scheduled learning hours: 17
Guided independent study hours: 83
As used by St Andrews: 2-hour Written Examination = 100%
As defined by QAA
Written examinations : 100%
Practical examinations : 0%
Coursework: 0%
Re-assessment: Oral Re-assessment = 100%
Module coordinator: Dr R T Baker
Module teaching staff: Dr R T Baker, Prof W Zhou
Module coordinator email rtb5@st-andrews.ac.uk