Skip to content

Module Catalogue

Breadcrumbs navigation

CH3715   Introduction to Analysis of Materials

Academic year(s): 2016-2017

Key information

SCOTCAT credits : 10

ECTS credits : 5

Level : SCQF level 9

Semester: 2

Planned timetable: TBC

The objective of this module is to introduce the principles of the most popular materials analysis methods using X-ray, ion beams, electrons and diffraction methods. The module will cover analytical principles of X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) together with secondar ion mass spectroscopy (SIMS) and X-ray Diffraction methods (XRD). Diffraction techniques will also be covered with the introductory aspects of Electron Energy Loss Spectroscopy (EELS) together with vibrational spectroscopic techniques.

Learning and teaching methods and delivery

Weekly contact:

Scheduled learning hours: 17

Guided independent study hours: 83

Assessment pattern

As used by St Andrews:

As defined by QAA
Written examinations : 100%
Practical examinations : 0%
Coursework: 0%

Personnel

Module teaching staff: TBC