CH3715
Introduction to Analysis of Materials
2016-2017
10
5
SCQF level 9
2
Academic year(s): 2016-2017
SCOTCAT credits : 10
ECTS credits : 5
Level : SCQF level 9
Semester: 2
Planned timetable:
The objective of this module is to introduce the principles of the most popular materials analysis methods using X-ray, ion beams, electrons and diffraction methods. The module will cover analytical principles of X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) together with secondar ion mass spectroscopy (SIMS) and X-ray Diffraction methods (XRD). Diffraction techniques will also be covered with the introductory aspects of Electron Energy Loss Spectroscopy (EELS) together with vibrational spectroscopic techniques.
Weekly contact:
Scheduled learning hours: 17
Guided independent study hours: 83
As used by St Andrews:
As defined by QAA
Written examinations : 100%
Practical examinations : 0%
Coursework: 0%